Symposium International de l'IEEE

Colloque / Symposium / Conférence

Symposium international de l’institut des ingénieurs électriciens et électroniciens (IEEE)

Dates

Du 03 juillet 2024 au 05 juillet 2024

Adresse

Institut National de Recherche en Informatique et en Automatique (INRIA)
Campus de Beaulieu - 263 Avenue Général Leclerc
35000 Rennes

Contact

IEEE (Institute of Electrical and Electronics Engineers)

Angeliki KRITIKAKOU & Marcello TRAIOLA - General co-chairs

Thématique

Technologie - TIC - Numérique

Public

Institutionnel | Professionnels

Participants

100 personnes attendues

The IEEE International Symposium on On-Line Testing and Robust System Design explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.

The 2024 edition of IOLTS will be a full in-person event organized at INRIA Center at Rennes University. It covers issues related to design for robustness, which is increasingly important in modern electronic systems. The huge complexity of electronic systems has led to growth in reliability needs in several application domains and pressure for low-cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins ; process, voltage, and temperature variations ; aging and wear-out ; soft error and EMI sensitivity ; power density and heating ; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs.

Tourisme éco-responsable